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Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

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Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
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German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
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Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
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An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
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Atomic Emission Spectroscopy: Instrumentation01:22

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Related Experiment Video

Updated: Mar 12, 2026

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
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X-ray reflectometer for single layer and multilayer coating characterization at 8 keV: An interlaboratory study.

Danielle N Gurgew1, David M Broadway2, Mikhail Gubarev2

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The Review of Scientific Instruments
|November 3, 2016
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A new X-ray reflectometer (XRR) system was developed for analyzing X-ray optic coatings. Interlaboratory studies confirmed its accuracy in reflectivity measurements, ensuring reliable characterization of optical materials.

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Area of Science:

  • Materials Science
  • Optics
  • Instrumentation

Background:

  • Characterizing X-ray optic coatings is crucial for advanced optical systems.
  • Existing methods may have limitations in precision and versatility.
  • The need for a reliable system for soft and hard X-ray applications.

Purpose of the Study:

  • To develop and describe a novel X-ray reflectometer (XRR) system.
  • To detail the design, capabilities, and operational parameters of the XRR instrument.
  • To validate the system's performance through interlaboratory comparisons.

Main Methods:

  • Utilized a high-output rotating anode source (RAS) with a copper target.
  • Employed precision slits for beam collimation and resolution control.
  • Incorporated a goniometer with rotary stages and a silicon drift detector for precise measurements.

Main Results:

  • The XRR system successfully generated X-ray radiation and isolated the Cu Kα line.
  • System parameters were optimized for reflectivity measurements across various grazing angles.
  • Interlaboratory study demonstrated comparable reflectivity measurements with external labs.

Conclusions:

  • The developed XRR system is capable of accurately characterizing soft and hard X-ray optic coatings.
  • The system's performance is validated by its agreement with external laboratory measurements.
  • This instrument provides a reliable tool for advancing X-ray optics research and development.