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Updated: Mar 12, 2026

11:33
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
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Corrigendum: A Direct Method to Extract Transient Sub-Gap Density of State (DOS) Based on Dual Gate Pulse
Scientific Reports
|November 3, 2016
Abstract
No abstract available in PubMed .
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