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Updated: Mar 12, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Effective method to study the thickness-dependent dielectric functions of nanometal thin film

Er-Tao Hu, Qing-Yuan Cai, Rong-Jun Zhang

    Optics Letters
    |November 3, 2016
    PubMed

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