Quantitative STEM Imaging of Order-Disorder Phenomena in Double Perovskite Thin Films

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr_{2}CrReO_{6}. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.