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Updated: Mar 12, 2026

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis

Published on: December 22, 2015

Single-shot network analyzer for extremely fast measurements.

Cejo Konuparamban Lonappan, Asad M Madni, Bahram Jalali

|November 10, 2016

Summary

This summary is machine-generated.

A novel instrument utilizes time-stretch technology for rapid frequency response measurements of optical and electronic devices. This breakthrough enables single-shot impulse response analysis in under 27 nanoseconds, accelerating production testing.

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Published on: August 6, 2018

Area of Science:

Optoelectronics
Measurement Science

Background:

High-bandwidth optical and electronic devices require fast and accurate characterization.
Existing measurement techniques can be time-consuming, limiting production-level testing.

Purpose of the Study:

To introduce a new instrument for fast frequency response measurement of high-bandwidth optoelectronic devices.
To demonstrate single-shot impulse response measurements with high bandwidth and low jitter.

Main Methods:

Utilizing time-stretch technology for single-shot frequency spectrum measurements.
Developing an instrument capable of 27 ns measurement times.
Achieving ultra-low jitter of 20.5 fs.

Main Results:

Demonstrated single-shot impulse response measurements with a 40 GHz bandwidth, extendable beyond 100 GHz.
Validated measurement accuracy by comparing with manufacturer specifications.
Achieved an ultra-low jitter of 20.5 fs.

Conclusions:

The new instrument significantly reduces test time for high-bandwidth optoelectronic devices.
Enables high-speed production-level testing and complex permittivity measurements.
Offers a cost-effective solution for characterizing optoelectronic components and materials.