Surface studies of solids using integral X-ray-induced photoemission yield

Area of Science:

• Materials Science
• Surface Science
• X-ray Physics

Background:

• Photoemission spectroscopy is limited by photoelectron escape depth.
• X-ray Fresnel reflectivity provides complementary structural information.
• Current methods require accessible surfaces for analysis.

Purpose of the Study:

• To demonstrate that hard X-ray photoemission yield contains structural information beyond the photoelectron escape depth.
• To show that this yield is modulated by the Fresnel reflectivity of multilayer structures.
• To develop a non-invasive method for evaluating buried layers.

Main Methods:

• Integral hard X-ray-induced photoemission yield measurement.
• Electric self-detection of photoemission.
• Fourier data analysis of yield modulation.
• Utilizing Fresnel reflectivity principles.

Main Results:

• Integral photoemission yield is modulated by multilayer Fresnel reflectivity.
• Structural information extends beyond the photoelectron escape depth.
• Layer thicknesses were accurately extracted using Fourier analysis.
• The method does not require detection of reflected X-rays.

Conclusions:

• Hard X-ray photoemission yield offers structural insights complementary to X-ray reflectivity.
• This technique enables non-invasive evaluation of buried layers in multilayer systems.
• The approach provides a versatile framework for advanced surface and subsurface analysis.