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Liquid-cell Transmission Electron Microscopy for Tracking Self-assembly of Nanoparticles
Published on: October 16, 2017
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From evaporation-induced self-assembly to shear-induced alignment.
R Srikantharajah1, T Schindler2, I Landwehr3
1Institute of Particle Technology, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstraße 4, 91058 Erlangen, Germany. wolfgang.peukert@fau.de.
Nanoscale
|November 24, 2016
Summary
Achieve highly ordered nanostructured thin films by controlling competing evaporation-induced self-assembly (EISA) and shear-induced alignment (SIA) during dip coating. This study provides processing guidelines for enhanced film homogeneity and order.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- The performance of nanostructured thin films relies on their structural order.
- Dip coating of nanorods involves competing evaporation-induced self-assembly (EISA) and shear-induced alignment (SIA).
Purpose of the Study:
- To demonstrate control over EISA and SIA for creating highly ordered and homogeneous thin films.
- To identify how process parameters influence EISA and SIA during dip coating.
Main Methods:
- Investigated the effects of temperature, initial volume fraction, and nanorod aspect ratio.
- Utilized in situ Small-Angle X-ray Scattering (SAXS), Raman spectroscopy, and Scanning Electron Microscopy (SEM) for analysis.
- Analyzed film thickness, surface order, and bulk order to differentiate evaporation and shear impacts.
Main Results:
- Established the distinct roles of evaporation and shear in film formation.
- Identified key process parameters influencing convective flow and shear forces.
- Successfully distinguished the impact of EISA and SIA on film characteristics.
Conclusions:
- Developed processing guidelines for controlled EISA and SIA in dip coating.
- Achieved highly ordered thin nematic films through parameter optimization.
- Provided a framework for fabricating ordered nanostructured films.
