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A method to characterize the roughness of 2-D line features: recrystallization boundaries

J Sun1, Y B Zhang1, A B Dahl2

  • 1Section for Materials Science and Advanced Characterization, Department of Wind Energy, Technical University of Denmark, Risø Campus, Roskilde, Denmark.

Journal of Microscopy
|November 30, 2016
PubMed

Keywords:
Area integral invariantboundarycurvatureelectron backscatter diffractionrecrystallizationroughness

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