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    This study introduces an instantaneous phase shifting deflectometry method using an iPhone 6 to measure deformable mirrors. The technique uses color multiplexing and Fourier analysis for rapid, accurate surface measurements.

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    Area of Science:

    • Optics and Photonics
    • Surface Metrology
    • Optical Engineering

    Background:

    • Deflectometry is a technique for measuring surface shape.
    • Phase shifting deflectometry (PSD) offers high accuracy but is typically slow.
    • Measuring dynamic surfaces requires instantaneous measurement capabilities.

    Purpose of the Study:

    • To develop and demonstrate an instantaneous phase shifting deflectometry (IPSD) method.
    • To enable real-time measurement of time-varying surfaces.
    • To compare IPSD with traditional Fourier transform profilometry (FTP).

    Main Methods:

    • Implemented IPSD using an iPhone 6 to capture fringe patterns.
    • Utilized color multiplexing to encode multiple phase-shifted patterns.
    • Applied Fourier transform techniques for pattern decomposition and surface reconstruction.

    Main Results:

    • Successfully measured a time-varying deformable mirror.
    • Demonstrated the instantaneous nature of the proposed method.
    • Provided a quantitative comparison with the Fourier transform profilometry method, highlighting accuracy and speed.

    Conclusions:

    • The developed IPSD method provides an effective solution for instantaneous surface metrology.
    • Color multiplexing combined with Fourier analysis enables rapid and accurate measurements.
    • The system shows potential for applications requiring real-time surface analysis of dynamic objects.