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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
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Highly compact fiber Fabry-Perot interferometer: A new instrument design.
B K Nowakowski1, D T Smith1, S T Smith2
1National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
The Review of Scientific Instruments
|December 3, 2016
Summary
This study introduces a compact, robust optical-fiber Fabry-Perot interferometer for precise nanometer-scale displacement measurement. Its design offers high tolerance to misalignment and environmental conditions, enabling versatile applications.
Area of Science:
- Optics and Photonics
- Metrology and Measurement Science
Background:
- Accurate displacement measurement is crucial across various scientific and industrial fields.
- Existing interferometers often face limitations in size, environmental robustness, and alignment sensitivity.
Purpose of the Study:
- To design, construct, and characterize a novel optical-fiber-based Fabry-Perot interferometer.
- To achieve continuous, high-precision displacement measurement over a wide range.
- To develop a compact and robust sensor tolerant to misalignment and harsh environments.
Main Methods:
- Utilized a simple Fabry-Perot cavity formed by an optical fiber end and a reflecting surface.
- Employed sinusoidal wavelength modulation of an infrared laser source.
- Implemented phase measurement derived from photodetector signals at modulation frequency (f) and its harmonic (2f).
- Applied compensation algorithms to reduce inherent non-linearities.
Main Results:
- Demonstrated a compact (125 µm diameter) displacement sensor with >5° misalignment tolerance.
- Achieved displacement measurement from nanometers to tens of millimeters.
- Reduced phase errors to below 3 nm using compensation algorithms.
- Enabled absolute surface separation measurement via wavelength sweep.
Conclusions:
- The developed optical-fiber interferometer offers a unique combination of compactness, robustness, and precision.
- The sensor is suitable for continuous displacement monitoring in diverse and challenging environments.
- This technology advances capabilities in high-resolution metrology.

