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$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

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Published on: June 19, 2018

A new setup for high resolution fast X-ray reflectivity data acquisition.

Milena Lippmann¹, Adeline Buffet¹, Kathrin Pflaum²

¹Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany.

The Review of Scientific Instruments

|December 3, 2016

Summary

This summary is machine-generated.

A novel fast X-ray reflectivity method enables rapid data acquisition. This technique allows in situ studies of dynamic structural changes in thin films, like poly(N-isopropylacrylamide).

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Area of Science:

Materials Science
Surface Science
X-ray Physics

Background:

X-ray reflectivity (XRR) is crucial for analyzing thin film structures.
Traditional XRR methods can be time-consuming, limiting in situ studies of dynamic processes.

Purpose of the Study:

To introduce a new, rapid X-ray reflectivity data acquisition method.
To demonstrate the method's capability for in situ investigation of time-temperature dependent structural changes.

Main Methods:

A fast rotating, slightly tilted sample setup.
Utilizing a stationary position-sensitive detector.
Achieving reflectivity curve measurements in a quarter of a second.

Main Results:

The developed method allows for significantly faster XRR measurements.
The technique is suitable for in situ monitoring of dynamic structural evolution.
Poly(N-isopropylacrylamide) thin film changes were successfully investigated.

Conclusions:

The fast XRR method is a powerful tool for studying dynamic thin film behavior.
This technique offers a significant advancement in materials characterization.
The presented results serve as a proof of principle for the new method.