Related Experiment Video
Updated: Mar 11, 2026

16:11
Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
9.9K
Upgraded millimeter-wave interferometer for measuring the electron density during the beam extraction in the negative
T Tokuzawa1, M Kisaki1, K Nagaoka1
1National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292, Japan.
The Review of Scientific Instruments
|December 3, 2016
Summary
An upgraded millimeter-wave interferometer measures electron density in negative ion sources. Electron density increases with arc power and drops during high-voltage beam extraction.
Area of Science:
- Plasma physics
- Fusion energy research
Background:
- Accurate measurement of electron density is crucial for optimizing negative ion sources used in fusion energy research.
- Previous measurement techniques faced limitations during high-voltage beam extraction.
Purpose of the Study:
- To upgrade a millimeter-wave interferometer for precise electron density measurements in a large-scaled negative ion source.
- To investigate the behavior of electron density during beam extraction.
Main Methods:
- Installed an upgraded 70 GHz millimeter-wave interferometer on a large-scaled negative ion source.
- Implemented several improvements including shorter wavelength probing, specialized horn antenna, digital phase detection, and insulator insertion.
- Performed measurements in front of the plasma grid, covering electron densities from 2 × 10^15 to 3 × 10^18 m^-3.
Main Results:
- Successfully measured line-averaged electron density during beam extraction.
- Observed a linear increase in electron density with increasing arc power.
- Detected a sudden drop in electron density upon initiation of high-voltage beam extraction.
Conclusions:
- The upgraded interferometer enables reliable electron density measurements in challenging negative ion source environments.
- Electron density is strongly correlated with operational parameters like arc power and beam extraction.
- These findings provide valuable data for optimizing negative ion source performance.
Related Concept Videos
Mass Analyzers: Common Types
1.8K
The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
1.8K
Mass Analyzers: Overview
2.0K
The mass analyzer is a crucial component of the mass spectrometer. In the ionization chamber, the vaporized sample is bombarded with a high-energy electron beam to generate a radical cation and further fragment into neutral molecules, radicals, and cations. A series of negatively charged accelerator plates accelerate the cations into the mass analyzer. The mass analyzer separates ions according to their mass-to-charge (m/z) ratios and then directs them to the detector. The common types of mass...
2.0K
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
2.4K
In inductively coupled plasma–mass spectrometry (ICP–MS), an inductively coupled plasma (ICP) torch is used as an atomizer and ionizer. Solid samples are dissolved and volatilized before being introduced into the high-temperature argon plasma, while solution samples are nebulized and passed through the high-temperature argon plasma. Plasma dissociates the analytes and ionizes their component atoms to form a mixture of positive ions and molecular species. The positive ions are then...
2.4K
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
903
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
903

