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Updated: Mar 11, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
A streaked X-ray spectroscopy platform for rapidly heated, near-solid density plasmas
C R Stillman1, P M Nilson1, S T Ivancic1
1Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA.
Abstract:
A picosecond, time-resolved, x-ray spectroscopy platform was developed to study the thermal line emission from rapidly heated solid targets containing buried aluminum or iron layers. The targets were driven by high-contrast 1ω or 2ω laser pulses at focused intensities up to 1 × 1019 W/cm2. The experimental platform combines time-integrating and time-resolved x-ray spectrometers. Picosecond time resolution was achieved with a pair of ultrafast x-ray streak cameras coupled to high-throughput Hall spectrometers. Time-integrated spectra were collected on each shot to correct the streaked data for variations in x-ray photocathode spectral sensitivity. The time-integrated spectrometer uses three elliptical crystals to disperse x rays with energies between 800 and 2100 eV with moderate (E/ΔE ∼ 450) resolving power. The streaked spectrometers accept four interchangeable conical crystals with higher resolving power (E/ΔE ∼ 650) to measure the brightest thermal lines in the 1300 to 1700 eV spectral range.
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