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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
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A classical description of subnanometer resolution by atomic features in metallic structures.
S Trautmann1, J Aizpurua, I Götz
1Leibniz Institute of photonic technology (IPHT), Albert-Einstein-Straße 9, D-07745 Jena, Germany. volker.deckert@uni-jena.de.
Nanoscale
|December 8, 2016
Summary
Atomic defects on plasmonic probes significantly enhance spatial resolution in spectroscopy. These atomic-scale features enable sub-nanometer resolution, crucial for advanced imaging techniques.
Area of Science:
- Plasmonics
- Nanotechnology
- Spectroscopy
Background:
- Plasmonic-enhanced probe spectroscopy has demonstrated sub-nanometer resolution.
- This resolution exceeds explanations based on nanoparticle radii alone.
Purpose of the Study:
- Investigate the impact of atomic-scale defects on plasmonic probe tips.
- Determine how these defects influence spatial resolution and field localization.
Main Methods:
- Analysis of crystalline metallic nanoparticles using transmission electron microscopy (TEM).
- Electrodynamic calculations using the Finite Element Method (FEM).
- Simulations under resonant and non-resonant illumination conditions.
Main Results:
- Atomic features like edge and corner sites are present on nanoparticles.
- These features critically affect lateral spatial resolution and field localization.
- Sub-nanometer resolution is achievable with atomic-scale defects.
Conclusions:
- Atomic-scale defects on plasmonic probes are key to achieving ultra-high spatial resolution.
- Understanding these defects refines the limits of plasmon-enhanced spectroscopy and microscopy.
- Sub-nanometer resolution is attainable for practical applications in nanoscale imaging.
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