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Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
All-Silicon Ultra-Broadband Infrared Light Absorbers
Kazim Gorgulu1, Abdullah Gok1, Mehmet Yilmaz2
1Department of Electrical and Electronics Engineering, Bilkent University, Ankara, 06800, Turkey.
Abstract:
Absorbing infrared radiation efficiently is important for critical applications such as thermal imaging and infrared spectroscopy. Common infrared absorbing materials are not standard in Si VLSI technology. We demonstrate ultra-broadband mid-infrared absorbers based purely on silicon. Broadband absorption is achieved by the combined effects of free carrier absorption, and vibrational and plasmonic absorption resonances. The absorbers, consisting of periodically arranged silicon gratings, can be fabricated using standard optical lithography and deep reactive ion etching techniques, allowing for cost-effective and wafer-scale fabrication of micro-structures. Absorption wavebands in excess of 15 micrometers (5-20 μm) are demonstrated with more than 90% average absorptivity. The structures also exhibit broadband absorption performance even at large angles of incidence (θ = 50°), and independent of polarization.
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