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Updated: Mar 10, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Michelangelo Vestita1, Giuseppe Giudice1, Domenico Bonamonte2
1Section of Plastic and Reconstructive Surgery, Department of Emergency and Organ Transplantation, University of Bari, Bari, Italy.
No abstract available in PubMed .