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Updated: Mar 9, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Sina Najmaei1, Sidong Lei2, Robert A Burke1
1United States Army Research Laboratories, Sensors and Electron Devices Directorate, 2800 Powder Mill Road, Adelphi, Maryland 20783, USA.
Controlling interfaces in molybdenum disulfide (MoS2) photodetectors enhances photoresponsivity but slightly slows response times. Interface engineering, specifically managing charge carrier traps, is key to optimizing these two-dimensional electronic devices.
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