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Temperature and microwave near field imaging by thermo-elastic optical indicator microscopy
Hanju Lee1, Shant Arakelyan1,2, Barry Friedman3
1Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul 121-742, Republic of Korea.
Scientific Reports
|December 23, 2016
Summary
We developed a practical imaging method for non-destructive testing. This technique visualizes temperature and microwave near fields using an optical microscope, enabling detailed material characterization.
Area of Science:
- Materials Science
- Electromagnetics
- Non-Destructive Testing
Background:
- High-resolution imaging of temperature and microwave near fields is crucial for non-destructive testing.
- Existing methods face challenges due to a lack of practical measurement pathways.
Purpose of the Study:
- To propose and experimentally demonstrate a practical method for visualizing temperature and microwave near fields.
- To overcome limitations in current non-destructive testing techniques.
Main Methods:
- Utilized a conventional CCD-based optical indicator microscope system.
- Employed a slide glass coated by a metal thin film as an indicator.
- Visualized heat source distribution from measured photoelastic images.
Main Results:
- Achieved optically resolved temperature, electric, and magnetic microwave near field images.
- Demonstrated comparable sensitivity, response time, and bandwidth to existing methods.
- Successfully characterized thermal and electromagnetic properties of materials and devices.
Conclusions:
- The developed method provides a practical pathway for high-resolution imaging of temperature and microwave near fields.
- This technique offers a valuable tool for non-destructive testing and material characterization.
- The method is applicable under various environmental conditions.
