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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis.

M Ruiz-Lopez¹, A Faenov², T Pikuz³

¹Empa, Materials Science and Technology, Dübendorf, Switzerland.

Journal of Synchrotron Radiation

|December 24, 2016

Summary

A new 2D Fresnel diffraction method enables rapid, single-shot metrology for coherent X-ray free-electron laser (XFEL) beamlines. This technique efficiently characterizes beam divergence and quality, crucial for experimental operations.

Keywords:

Fresnel diffraction LiF SACLA X-ray X-ray imaging detector beam metrology color centers fourth-generation source

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Area of Science:

Optics and photonics
X-ray science
Metrology

Background:

Direct metrology of coherent short-wavelength beamlines is essential for determining operational beam characteristics.
Beam-time limitations necessitate fast, multi-parametric metrology, ideally from a single shot.

Purpose of the Study:

To develop and apply a 2D Fresnel diffraction-based procedure for efficient and detailed beamline characterization.
To overcome limitations of conventional detectors in resolving high-frequency Fresnel diffraction fringes.

Main Methods:

Utilized high-resolution Fresnel diffraction analysis.
Employed an irradiated lithium fluoride (LiF) crystal for high-spatial-frequency imaging.
Retrieved 2D coherence degree, beam divergence, and beam quality factor (M²) from diffraction patterns.

Main Results:

Successfully applied a 2D metrology procedure at the SACLA XFEL beamline.
Demonstrated efficient and detailed characterization of beamline parameters.
Validated the method using a laboratory reference laser.

Conclusions:

The developed Fresnel diffraction metrology effectively characterizes beam properties from single shots.
High-spatial-frequency imaging with LiF crystals unlocks the full potential of Fresnel diffraction for beamline diagnostics.
This method provides accurate beam metrology, aligning with source specifications.