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Direct tomography imaging for inelastic X-ray scattering experiments at high pressure.

Ch J Sahle1, A D Rosa1, M Rossi1

  • 1European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France.

Journal of Synchrotron Radiation
|December 24, 2016
PubMed
Summary

This study introduces a new method to isolate sample signals from diamond anvil cell (DAC) interference in X-ray scattering experiments. This technique enables clearer high-pressure measurements and reveals a phase transition in quartz.

Keywords:
diamond anvil celldirect tomographyhigh pressureinelastic X-ray scattering

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Spectroscopy

Background:

  • High-pressure experiments using diamond anvil cells (DACs) often suffer from interfering signals from the cell components.
  • Parasitic scattering from diamonds, gaskets, and pressure media can obscure sample signals, hindering analysis.
  • Absorption edge overlaps between sample and DAC materials complicate inelastic X-ray measurements like X-ray Raman scattering spectroscopy.

Purpose of the Study:

  • To develop a method for separating non-resonant inelastic X-ray scattering signals from the sample and the high-pressure sample environment.
  • To overcome limitations imposed by parasitic signals in high-pressure X-ray scattering experiments.
  • To demonstrate the technique's effectiveness for analyzing compressed materials.

Main Methods:

  • Utilizing spatially resolved detection of scattered X-rays to distinguish sample signals from diamond anvil cell (DAC) contributions.
  • Employing simple machine learning algorithms to identify detector pixels corresponding to the sample signal.
  • Acquiring high-quality X-ray Raman scattering spectra of compressed α-quartz.

Main Results:

  • Successfully separated sample signals from spurious scattering originating from the DAC without restricting detection angles.
  • Achieved unprecedented spectral quality for the Si L2,3-edge and O K-edge of compressed α-quartz.
  • Observed clear evidence of a pressure-induced phase transition in α-quartz between 10 and 24 GPa.

Conclusions:

  • The developed spatially resolved X-ray scattering technique effectively isolates sample signals in high-pressure DAC experiments.
  • Machine learning aids in processing the spatially resolved data, simplifying analysis.
  • The method provides high-quality spectra, enabling the detection of pressure-induced phase transitions in materials like α-quartz.