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X-ray fluorescence at nanoscale resolution for multicomponent layered structures: a solar cell case study.

Bradley M West1, Michael Stuckelberger1, April Jeffries2

  • 1School of Electrical, Computer, and Energy Engineering, Arizona State University, 551 E Tyler Mall, Tempe, AZ 85281, USA.

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|December 24, 2016
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Summary

Accurate elemental quantification in multilayered materials using X-ray fluorescence microscopy is challenging. A new procedure corrects for X-ray attenuation and thickness variations, improving elemental distribution analysis.

Keywords:
CIGSX-ray fluorescencemultilayered structuresolar cellthin film characterization

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Spatially resolved X-ray fluorescence microscopy is crucial for analyzing complex materials.
  • Accurate quantification of elemental distributions in multilayered systems is hindered by X-ray attenuation and sample variations.

Purpose of the Study:

  • To develop and validate a widely applicable procedure for correcting elemental quantification in multilayered samples.
  • To address challenges posed by high X-ray attenuation, depth-dependent composition, and thickness variations.

Main Methods:

  • A novel procedure based on Beer-Lambert's law is presented in integral and numerical forms.
  • The method corrects measured fluorescence signals for incident beam and generated fluorescence attenuation across multiple layers.
  • Sample thickness variations are explicitly accounted for in the quantification process.

Main Results:

  • The procedure was successfully applied to experimental data from a solar cell with a copper indium gallium selenide absorber layer.
  • Corrections significantly impacted the interpretation of elemental distributions, highlighting their importance.
  • Validation was performed using data from two different synchrotron beamlines with varied geometries.

Conclusions:

  • The developed procedure offers a robust solution for accurate elemental quantification in complex multilayered materials.
  • Accurate corrections are essential for reliable material characterization and can dramatically alter analysis outcomes.
  • This method enhances the utility of X-ray fluorescence microscopy for advanced material studies.