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Updated: Mar 9, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
I A Ivanov1,2, Chang Hee Nam1,3, Kyung Taec Kim1,3
1Center for Relativistic Laser Science, Institute for Basic Science, Gwangju 500-712, Republic of Korea.
We analyzed strong field ionization using the Bohmian approach, retaining electron trajectories. Our findings justify the concept of exit points in the tunneling regime, crucial for understanding ionization dynamics.
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