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Related Experiment Videos

Progress toward structure determination.

J Gjønnes1, A Olsen, H Matsuhata

  • 1Department of Physics, University of Oslo, Norway.

Journal of Electron Microscopy Technique
|October 1, 1989
PubMed
Summary
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Convergent-beam electron diffraction (CBED) offers superior precision for measuring diffracted intensity compared to selected-area diffraction. This advancement enables more accurate determination of crystal structure parameters and structure factors.

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Selected-area diffraction is a traditional method for analyzing crystal structures using electron microscopy.
  • This method has limitations in precision for quantitative intensity measurements.
  • Convergent-beam electron diffraction (CBED) offers a more advanced approach.

Purpose of the Study:

  • To highlight the advantages of CBED over selected-area diffraction for precise intensity measurements.
  • To explore various measurement strategies within CBED for structure factor and parameter determination.
  • To review recent developments and applications of CBED in crystallography.

Main Methods:

  • Utilizing convergent-beam electron diffraction (CBED) for precise intensity measurements.

Related Experiment Videos

  • Recording diffracted intensities at well-defined beam directions within specific reflection disks.
  • Employing zone axis intensities and Kossel line analysis (profiles, integrated intensities, vanishing contrast, segment separation) for structural analysis.

    • Main Results:

    • CBED provides significantly more precise measurements of diffracted intensity than selected-area diffraction.
    • Various CBED-based measurement techniques (zone axis intensities, Kossel lines) are effective for refining structure parameters and determining structure factors.
    • Recent advancements extend the scope of CBED to larger unit cells and improve measurement precision.

    Conclusions:

    • CBED is a powerful technique for quantitative analysis in electron crystallography.
    • The methods discussed offer enhanced accuracy for structure parameter refinement and structure factor determination.
    • Ongoing developments promise further improvements in precision and applicability of CBED.