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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Mar 8, 2026

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Nanoscale subsurface imaging.

M Soliman¹, Y Ding, L Tetard

¹NanoScience Technology Center, 12424 Research Parkway, University of Central Florida, Orlando, FL, 32826, United States of America. Materials Science and Engineering, 12760 Pegasus Drive, University of Central Florida, Orlando, FL, 32816, United States of America.

Journal of Physics. Condensed Matter : an Institute of Physics Journal

|February 1, 2017

Summary

This summary is machine-generated.

This review explores nanoscale imaging techniques for subsurface analysis, focusing on atomic force microscopy (AFM). It covers structural and functional property mapping for complex systems, advancing metrology for defect detection and material characterization.

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Area of Science:

Nanoscale metrology and imaging
Materials science and engineering
Surface science and characterization

Background:

Significant interest exists in probing nanoscale structures and functional properties, both on surfaces and within the volume of complex systems.
Advanced exploration of chemical or electrical properties, beyond detecting subsurface heterogeneities, cracks, and defects, is of great interest.
Recent years have seen substantial attention drawn to the ability to probe structures and functional properties of complex systems at the nanoscale.

Purpose of the Study:

To review approaches for exploring subsurface heterogeneities.
To discuss recent progress in metrology across optics, electron microscopy, and scanning probe microscopy.
To highlight advances in nanoscale structural and functional imaging, particularly those based on atomic force microscopy (AFM).

Main Methods:

Discussion of image formation principles and mechanisms for various techniques.
Coverage of data acquisition, data analysis, and modeling for nanoscale imaging.
Focus on methods providing structural information (position, geometry) and functional properties (conductivity, capacitance, composition).

Main Results:

Review of techniques for structural characterization of buried nanoscale features.
Presentation of methods for extracting functional properties from subsurface structures.
Exploration of potential for tomography reconstructions of complex systems like transistors and living systems.

Conclusions:

Atomic force microscopy (AFM) based approaches show significant advances in nanoscale subsurface metrology.
Current modalities enable both structural and functional property mapping of buried nanoscale features.
Future perspectives highlight challenges and needs for advancing nanoscale tomography and characterization.