Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Acute Extrinsic Activation of the RANKL Pathway Decreases Wound Healing and Functional Recovery After Spinal Cord Injury in Mice.

Glia·2025

Same author

'PartBreCon' study. A UK multicentre retrospective cohort study to assess outcomes following PARTial BREast reCONstruction with chest wall perforator flaps.

Breast (Edinburgh, Scotland)·2023

Same author

Impact of bariatric surgery on early-onset colorectal cancer risk: a systematic review and meta-analysis.

Updates in surgery·2023

Same author

Primary retrograde urinary drainage using image and endoscopy guidance via urostomies.

Clinical radiology·2022

Same author

Optimal design of robust resilient automatic voltage regulators.

ISA transactions·2020

Same author

Demyelinating neuropathy and local toxicity caused by extravasated Brentuximab vedotin.

Journal of the European Academy of Dermatology and Venereology : JEADV·2020

Same journal

Interplay of Anisotropy, Dzyaloshinskii Moriya Interaction and Symmetry breaking Fields in a 2D XY Ferromagnet.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

Same journal

Single-molecule electron transport near a charge-trapping orbital-level alignment.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

Same journal

Δ<sub>T</sub>Noise as a Robust Diagnostic for Chiral, Helical and Trivial Edge Modes.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

Same journal

A Quantum Framework for Negative Magnetoresistance in Multi-Weyl Semimetals.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

Same journal

Magnetic anisotropy and electronic structure in surface-supported single rare-earth atom magnets: a topical review.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

Same journal

Modeling thermal transport in AlN/GaN superlattices and heterostructures with machine-learned force fields.

Journal of physics. Condensed matter : an Institute of Physics journal·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Mar 8, 2026

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Nanoscale subsurface imaging.

M Soliman¹, Y Ding, L Tetard

¹NanoScience Technology Center, 12424 Research Parkway, University of Central Florida, Orlando, FL, 32826, United States of America. Materials Science and Engineering, 12760 Pegasus Drive, University of Central Florida, Orlando, FL, 32816, United States of America.

Journal of Physics. Condensed Matter : an Institute of Physics Journal

|February 1, 2017

Summary

This summary is machine-generated.

This review explores nanoscale imaging techniques for subsurface analysis, focusing on atomic force microscopy (AFM). It covers structural and functional property mapping for complex systems, advancing metrology for defect detection and material characterization.

More Related Videos

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Detection and Quantification of Tunneling Nanotubes Using 3D Volume View Images

Detection and Quantification of Tunneling Nanotubes Using 3D Volume View Images

Published on: August 31, 2022

Related Experiment Videos

Last Updated: Mar 8, 2026

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Detection and Quantification of Tunneling Nanotubes Using 3D Volume View Images

Detection and Quantification of Tunneling Nanotubes Using 3D Volume View Images

Published on: August 31, 2022

Area of Science:

Nanoscale metrology and imaging
Materials science and engineering
Surface science and characterization

Background:

Significant interest exists in probing nanoscale structures and functional properties, both on surfaces and within the volume of complex systems.
Advanced exploration of chemical or electrical properties, beyond detecting subsurface heterogeneities, cracks, and defects, is of great interest.
Recent years have seen substantial attention drawn to the ability to probe structures and functional properties of complex systems at the nanoscale.

Purpose of the Study:

To review approaches for exploring subsurface heterogeneities.
To discuss recent progress in metrology across optics, electron microscopy, and scanning probe microscopy.
To highlight advances in nanoscale structural and functional imaging, particularly those based on atomic force microscopy (AFM).

Main Methods:

Discussion of image formation principles and mechanisms for various techniques.
Coverage of data acquisition, data analysis, and modeling for nanoscale imaging.
Focus on methods providing structural information (position, geometry) and functional properties (conductivity, capacitance, composition).

Main Results:

Review of techniques for structural characterization of buried nanoscale features.
Presentation of methods for extracting functional properties from subsurface structures.
Exploration of potential for tomography reconstructions of complex systems like transistors and living systems.

Conclusions:

Atomic force microscopy (AFM) based approaches show significant advances in nanoscale subsurface metrology.
Current modalities enable both structural and functional property mapping of buried nanoscale features.
Future perspectives highlight challenges and needs for advancing nanoscale tomography and characterization.