You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Mar 8, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
This study investigates complex post-processing artifacts in sparse aperture imaging, validating model predictions with real data to improve image quality analysis.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: