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Updated: Mar 7, 2026

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
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Characterization of digital dispersive spectrometers by low coherence interferometry.
Optics Express
|March 1, 2017
Summary
We present a new method to characterize digital spectrometers using Fourier transform spectroscopy on each pixel. This technique fully describes the spectrometer
Area of Science:
- Spectroscopy
- Optical Engineering
- Computational Science
Background:
- Digital dispersive spectrometers require calibration for accurate spectral response.
- Existing methods often need prior knowledge of system parameters.
- Characterizing the full spectral response is crucial for precise measurements.
Purpose of the Study:
- To develop a calibration-free procedure for determining the spectral response of digital dispersive spectrometers.
- To create a comprehensive characterization of spectrometer performance.
- To enable numerical improvement of spectrometer resolution.
Main Methods:
- Applying Fourier transform spectroscopy (FTS) to individual pixels of a CCD detector.
- Developing a response matrix that encapsulates the spectrometer's behavior.
- Utilizing the response matrix to analyze system-point spread function and pixel width effects.
Main Results:
- A novel procedure for full spectral response determination without prior system knowledge.
- Generation of a response matrix that uniquely characterizes the spectrometer.
- Demonstration of improved spectrometer resolution and predictive capabilities.
Conclusions:
- The proposed FTS-based pixel-level analysis offers a complete spectrometer characterization.
- This method accounts for system-point spread function and finite pixel width.
- The approach is broadly applicable to various spectroscopic fields, enhancing computational spectroscopy and hyperspectral imaging.
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