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Digital Inline Holographic Microscopy DIHM of Weakly-scattering Subjects
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Probe reconstruction for holographic X-ray imaging.

Johannes Hagemann1, Anna Lena Robisch1, Markus Osterhoff1

  • 1Institut für Röntgenphysik, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany.

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|March 1, 2017
PubMed
Summary

Two methods for reconstructing X-ray nano-probe wavefronts were compared. Both schemes showed excellent agreement, improving X-ray holographic near-field imaging quality and aiding optics alignment at beamlines.

Keywords:
X-ray near-field imagingprobe characterizationptychography

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Area of Science:

  • Physics
  • Optics
  • Materials Science

Background:

  • High resolution in X-ray holographic near-field imaging is limited by beam quality and focusing artifacts.
  • Accurate characterization of the X-ray probe wavefront is crucial for image fidelity.

Purpose of the Study:

  • To present and compare two novel schemes for reconstructing the complex-valued wavefront of X-ray nano-probes.
  • To evaluate the effectiveness of these schemes for improving imaging performance and optics alignment.

Main Methods:

  • Near-field ptychography involving lateral and longitudinal scanning of a test pattern.
  • A multi-plane projection algorithm reconstructing wavefronts from longitudinal detector translations without a test pattern.

Main Results:

  • Both presented schemes yielded highly consistent results for wavefront reconstruction.
  • The reconstructed probe wavefronts are valuable for precise optics alignment at X-ray nanoprobe beamlines.
  • Integrating probe retrieval with object reconstruction significantly enhances holographic near-field imaging quality.

Conclusions:

  • Developed methods effectively reconstruct X-ray nano-probe wavefronts, crucial for advanced imaging.
  • These techniques offer practical solutions for optics alignment and image quality improvement in X-ray microscopy.
  • The findings advance the capabilities of X-ray holographic near-field imaging techniques.