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Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications

Simon Hettler1, Manuel Dries1, Peter Hermann1

  • 1Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie, Engesserstrasse 7, 76131 Karlsruhe, Germany.

Micron (Oxford, England : 1993)
|March 2, 2017
PubMed

Keywords:
ContaminationElectron-beam induced chargingGraphitized carbonPhase plateScanning transmission electron microscopyThin film

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