Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

Atomic Emission Spectroscopy: Overview

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...

Atomic Emission Spectroscopy: Lab

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...

Atomic Emission Spectroscopy: Instrumentation

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Predicting growth, water-use efficiency and drought response through machine learning, GWAS and differential expression in Ponderosa pine.

BMC plant biology·2026

Same author

Structural properties, polymorphism, and multiscale disorder unravel energy transport limitations in perylene diimide semiconductors.

Science advances·2026

Same author

Low-Dose Electron Total Scattering Analysis Resolves Non-Crystalline Phase Separation in Polymer Semiconductors and Device Multilayers.

Small methods·2026

Same author

Hybrid physics-machine learning models for quantitative electron diffraction refinements.

Nature communications·2026

Same author

Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy.

Ultramicroscopy·2026

Same author

Mapping a career in electron microscopy.

Nature reviews. Chemistry·2026

Search research articles

Related Experiment Video

Updated: Mar 6, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Progress and opportunities in EELS and EDS tomography.

Sean M Collins¹, Paul A Midgley¹

¹Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom.

Ultramicroscopy

|March 5, 2017

Summary

Advancements in electron tomography enhance 3D nanoscale chemical and physical analysis using energy loss and X-ray spectroscopy. Model-based approaches integrate signal generation, detection, and machine learning for improved reconstructions and quantitative insights.

Keywords:

Compressed sensing EDS EELS Electron tomography

More Related Videos

Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis

Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis

Published on: November 20, 2013

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Related Experiment Videos

Last Updated: Mar 6, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis

Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis

Published on: November 20, 2013

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

Published on: June 26, 2015

Area of Science:

Materials Science
Chemistry
Physics
Microscopy

Background:

Electron tomography combines microscopy with spectroscopy for 3D nanoscale analysis.
Energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) are key techniques.
Rapid advancements enable new insights into material chemistry and physics.

Purpose of the Study:

To present a cohesive framework for analytical electron tomography.
To highlight recent progress in improving tomographic reconstructions.
To demonstrate the flexibility and feasibility of model-based approaches.

Main Methods:

Applying compressed sensing methods to EELS and EDS data.
Characterizing advanced detector technologies.
Developing improved signal generation models.
Exploring machine learning for signal processing.
Utilizing a model-based approach incorporating signal physics and prior structural knowledge.

Main Results:

Demonstrated improvements in tomographic reconstructions using advanced methods.
Showcased the flexibility of model-based approaches for non-linear or limited signals.
Illustrated the feasibility of integrating diverse techniques within a unified framework.

Conclusions:

Model-based analytical electron tomography offers a powerful framework for nanoscale 3D chemical and physical characterization.
Further integration of modalities and synergistic processing will push spatial resolution and information recovery limits.
Continued development promises enhanced precision in quantitative spectroscopic tomography.