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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways.

Xiahan Sang1,2, Andrew R Lupini2,3, Jilai Ding1

  • 1Center for Nanophase Materials Sciences Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.

Scientific Reports
|March 9, 2017
PubMed
Summary
This summary is machine-generated.

Precise atomic-resolution imaging using scanning transmission electron microscopy (STEM) is improved with spiral scanning paths. This method corrects beam deviations, reducing image distortions for better material analysis.

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Area of Science:

  • Materials Science
  • Microscopy
  • Physics

Background:

  • Atomic-resolution imaging in aberration-corrected scanning transmission electron microscopy (STEM) links atomic structure to material properties.
  • Precise control of the electron probe's location is crucial but challenging due to deflector properties causing beam deviations and image distortions.
  • Conventional raster scanning suffers from fly-back distortions caused by sudden beam location changes.

Purpose of the Study:

  • To develop and validate a spiral scanning methodology for precise electron probe control in STEM.
  • To minimize image distortions in STEM imaging, enabling higher resolution and fidelity.
  • To improve the feasibility of in situ and high-temporal-resolution imaging of beam-sensitive materials.

Main Methods:

  • Utilized spiral scanning paths, including "Archimedean" spirals with constant angular frequency, to characterize beam response at different frequencies.
  • Developed characteristic functions based on Archimedean spirals to correct distortions in more complex constant linear velocity (CLV) spiral scans.
  • Combined CLV scanning with beam path corrections to mitigate scan distortions.

Main Results:

  • Spiral scanning paths offer more precise control of a sub-Ångstrom electron probe compared to raster scans.
  • The proposed method effectively corrects image distortions in CLV spiral scans.
  • Spiral scan images demonstrated significantly reduced scan distortion relative to conventional raster scan images.

Conclusions:

  • The developed spiral scanning technique with beam path corrections enhances the precision of atomic-resolution STEM imaging.
  • This methodology is valuable for in situ STEM observations and imaging of delicate materials requiring high temporal resolution.
  • The approach offers a pathway to overcome limitations of conventional scanning methods in advanced electron microscopy.