Joint A Contrario Ellipse and Line Detection

We propose a line segment and elliptical arc detector that produces a reduced number of false detections on various types of images without any parameter tuning. For a given region of pixels in a grey-scale image, the detector decides whether a line segment or an elliptical arc is present (model validation). If both interpretations are possible for the same region, the detector chooses the one that best explains the data (model selection ). We describe a statistical criterion based on the a contrario theory, which serves for both validation and model selection. The experimental results highlight the performance of the proposed approach compared to state-of-the-art detectors, when applied on synthetic and real images.