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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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83.4  W, 17.69  kHz spectral bandwidth, continuous-wave, beam densely folded Innoslab amplifier

Jian Ning, Kezhen Han, Jingliang He

    Optics Letters
    |March 16, 2017
    PubMed

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