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Updated: Mar 6, 2026

User-friendly, High-throughput, and Fully Automated Data Acquisition Software for Single-particle Cryo-electron Microscopy
Published on: July 29, 2021
Michal Dagan1, Baptiste Gault1, George D W Smith1
11Department of Materials,University of Oxford,Parks Road,Oxford,OX1 3PHUK.
A new automated method reconstructs field ion microscopy (FIM) data, preserving atomistic detail. This technique accurately maps atoms in 3D, enabling advanced defect analysis in materials science.
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