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Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data.

Michal Dagan1, Baptiste Gault1, George D W Smith1

  • 11Department of Materials,University of Oxford,Parks Road,Oxford,OX1 3PHUK.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 21, 2017
PubMed
Summary

A new automated method reconstructs field ion microscopy (FIM) data, preserving atomistic detail. This technique accurately maps atoms in 3D, enabling advanced defect analysis in materials science.

Keywords:
3D reconstructionatomic resolutioncrystal defectsfield ion microscopy

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Field Ion Microscopy (FIM) provides atomic-scale surface characterization.
  • Existing FIM analysis lacks automation, limiting its full potential.
  • Direct imaging of crystal defects like vacancies is possible with FIM.

Purpose of the Study:

  • To develop an automated procedure for reconstructing Field Ion Microscopy (FIM) data.
  • To maintain the atomistic nature of FIM data throughout the reconstruction process.
  • To enable advanced analyses of atomic behavior and material defects.

Main Methods:

  • Developed an automated reconstruction algorithm for FIM data.
  • Algorithm relies on minimal assumptions and tracks atomic coordinates across 2D images.
  • Allocates imaged atoms to their respective crystallographic planes for 3D reconstruction.

Main Results:

  • Achieved highly accurate 3D lattice-resolved reconstructions of FIM data.
  • Successfully applied the procedure to over 2000 tungsten atoms and ion-implanted planes.
  • Demonstrated applicability to carbides in a steel matrix, showing material versatility.

Conclusions:

  • The automated procedure accurately reconstructs FIM data, preserving atomistic detail.
  • This method facilitates advanced analyses, including defect detection and surface displacement.
  • The approach enhances the accuracy and scope of 3D FIM and atom probe characterization.