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Atomic force microscopy analysis of enamel nanotopography after interproximal reduction
Lydia Meredith1, Mauro Farella1, Sam Lowrey2
1Discipline of Orthodontics, Department of Oral Sciences, Sir John Walsh Research Institute, Faculty of Dentistry, University of Otago, Dunedin, New Zealand.
Summary
Interproximal reduction (IPR) instruments create varied enamel nanotopography. Polishing with Sof-Lex discs after IPR significantly smooths enamel, resulting in surfaces smoother than untreated enamel, potentially reducing caries risk.
Area of Science:
- Dental materials science
- Surface topography analysis
- Nanotechnology in dentistry
Background:
- Interproximal reduction (IPR) is crucial in orthodontics but can roughen enamel surfaces.
- Enamel surface alterations post-IPR may increase susceptibility to caries.
- Understanding enamel nanotopography after IPR is vital for preventive strategies.
Purpose of the Study:
- To assess the nanotopography of enamel surfaces created by common IPR instruments.
- To evaluate the impact of polishing on enamel surface roughness after IPR.
Main Methods:
- Enamel slabs from premolars were subjected to IPR using diamond burs, strips, or discs.
- Polishing was performed using Sof-Lex discs.
- Atomic force microscopy (AFM) was employed to analyze enamel surface nanotopography.
Main Results:
- All IPR instruments produced rougher enamel than controls.
- Larger grit instruments (medium burs/strips) created rougher surfaces than finer grit counterparts.
- Sof-Lex polishing significantly reduced enamel roughness, yielding surfaces smoother than untreated enamel.
Conclusions:
- IPR instruments yield diverse enamel nanotopography and roughness.
- Diamond burs, strips, and discs result in increased surface roughness.
- Sof-Lex polishing effectively minimizes enamel roughness post-IPR, creating a smoother surface than the original untreated enamel.