Related Experiment Videos
Electron emission projection imager
Stanislav S Baturin1, Sergey V Baryshev2
1Department of Physics, The University of Chicago, 5720 S. Ellis Ave., Chicago, Illinois 60637, USA.
The Review of Scientific Instruments
|April 5, 2017
Summary
A novel projection imaging system visualizes field emission sites on cathodes with high spatial resolution. This advanced imaging offers superior sensitivity for detecting low field emission currents, below 1 nA.
Area of Science:
- Physics
- Materials Science
- Electrical Engineering
Background:
- Field emission is crucial for various electronic devices.
- Direct imaging of field emission sites is challenging.
- Current methods lack sufficient spatial resolution or sensitivity.
Purpose of the Study:
- To present a new projection type imaging system for field emission.
- To enable direct imaging of field emission site distribution on cathode surfaces.
- To achieve high spatial resolution and sensitivity in imaging.
Main Methods:
- Utilized a standard parallel plate configuration with anode screens.
- Developed a projection imaging system.
- Employed techniques for high-resolution imaging of electron emission.
Main Results:
- Successfully imaged field emission site distribution directly on cathode surfaces.
- Achieved a lateral spatial resolution on the order of 1-10 μm.
- Demonstrated imaging sensitivity to field emission current better than 1 nA, surpassing typical electrometers.
Conclusions:
- The presented system offers a significant advancement in imaging field emission.
- High spatial resolution and sensitivity enable detailed analysis of emission sites.
- This technology has potential applications in advanced electronic device development and characterization.