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Characterization of micro structure through hybrid interference and phase determination in broadband light
Applied Optics
|April 5, 2017
Summary
This study introduces a hybrid interferometry technique for surface profiling. It combines light intensity and spectral modulation to overcome instability issues in conventional methods, enhancing measurement robustness and resolution.
Area of Science:
- Optical metrology
- Surface characterization
- Interferometric techniques
Background:
- Broadband light interferometry is a key technique for surface profiling.
- Conventional methods using light irradiance for zero fringe order detection suffer from instability due to intensity fluctuations and external light.
- This instability limits accuracy and reliability in surface measurement systems.
Purpose of the Study:
- To develop a hybrid interferometric technique for robust surface profiling.
- To suppress light instability and improve the accuracy of zero optical path difference determination.
- To enhance the sensitivity, robustness, and stability of interferometric surface measurement systems.
Main Methods:
- A hybrid technique combining light intensity and spectral modulation was developed.
- Phase evaluation at each pixel was employed for high vertical resolution micro-structure characterization.
- Simulations and experimental verification on a micro-dome structure were performed.
Main Results:
- The hybrid method effectively suppresses light instability.
- High vertical resolution was achieved for micro-structure characterization.
- The method demonstrated improved sensitivity, robustness, and stability compared to conventional techniques.
Conclusions:
- The proposed hybrid interferometry method offers a significant improvement over intensity-based techniques.
- It is particularly promising for surface profiling in complex and unstable environments.
- This technique enhances the reliability and precision of micro-structure characterization.