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Steps length error detector algorithm in phase-shifting interferometry using Radon transform as a profile

Tania A Ramirez-Delreal, Miguel Mora-Gonzalez, Francisco J Casillas-Rodriguez

    Optics Express
    |April 7, 2017
    PubMed
    Summary
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    This study introduces a new method using the Radon transform to detect and measure calibration errors in phase-shifting interferometry. The technique accurately quantifies phase shifter deviations in digital interferometry systems.

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Digital Image Processing

    Background:

    • Phase-shifting interferometry is crucial for precise displacement estimation.
    • Phase shifter miscalibration is a common and significant error source.
    • Existing methods struggle with unexpected phase shifts and device variability.

    Purpose of the Study:

    • To develop a novel technique for detecting and measuring phase shifter calibration errors.
    • To address the challenge of unexpected phase shifts in interferometric measurements.
    • To provide an alternative method for phase shifter calibration.

    Main Methods:

    • Utilizes the Radon transform for automatic calibration and profile measurement.
    • Analyzes specific zones of interferograms to register maximum and minimum value parameters.

    Related Experiment Videos

  • Applies the method to both synthetic and real interferograms.

    • Main Results:

    • The proposed algorithm effectively detects and quantifies calibration errors in phase-shifting interferometry.
    • Achieved good approximations for error measurement across various interferogram fringe distributions and phase-shifting steps.
    • Demonstrated the algorithm's ability to measure deviations in phase-shifting steps.

    Conclusions:

    • The Radon transform-based method offers a robust solution for phase shifter calibration errors.
    • This technique provides a reliable alternative for calibrating phase shifter devices.
    • The algorithm is effective regardless of interferogram complexity or step variations.