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Related Experiment Videos

Method to simulate and analyse induced stresses for laser crystal packaging technologies.

Pol Ribes-Pleguezuelo, Site Zhang, Erik Beckert

    Optics Express
    |April 7, 2017
    PubMed
    Summary

    A new simulation method assessed stresses in laser crystal packaging using solderjet bumping. Results show this low-stress technique minimally impacts laser beam quality, preserving polarization and wavelength.

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    Area of Science:

    • Optical Engineering
    • Materials Science
    • Computational Mechanics

    Background:

    • Laser crystal packaging is critical for optical system performance.
    • Traditional packaging methods can induce stress, affecting laser properties.
    • The solderjet bumping technique offers a low-stress alternative for optics assembly.

    Purpose of the Study:

    • To develop and validate a simulation method for induced stresses in laser crystal packaging.
    • To analyze the impact of a low-stress packaging technique on laser cavity birefringent effects.
    • To evaluate the performance of laser cavities assembled using the solderjet bumping technique.

    Main Methods:

    • Thermo-mechanical simulations were performed using ANSYS 17.0 to model induced stresses.
    • Simulation results were imported into VirtualLab Fusion for optical beam analysis.

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  • Analysis focused on wavelength and polarization of input and output laser beams.

    • Main Results:

    • The simulation method effectively modeled stresses associated with laser crystal packaging.
    • The solderjet bumping technique resulted in negligible differences between input and output laser beams.
    • Birefringent effects within the laser cavity were found to be minimal.

    Conclusions:

    • The developed simulation method is suitable for assessing packaging-induced stresses in laser crystals.
    • The solderjet bumping technique is a viable low-stress method for packaging laser optics.
    • This technique preserves the integrity of laser beams, maintaining wavelength and polarization.