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Computer vision distortion correction of scanning probe microscopy images.
Iaroslav Gaponenko1, Philippe Tückmantel2, Benedikt Ziegler2,3
1Department of Quantum Matter Physics, University of Geneva, 1211, Geneva, Switzerland. iaroslav.gaponenko@unige.ch.
Scientific Reports
|April 8, 2017
Summary
A new computer-vision algorithm corrects scanning probe microscopy distortions, enabling precise nanoscale imaging. This method tracks material properties like polarization switching and graphene wrinkling with high accuracy.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Scanning probe microscopy (SPM) is crucial for nanoscale surface analysis.
- Piezoelectric actuator drifts and nonlinearities limit SPM precision.
- Accurate correlation of spatial data with time and functionality is challenging.
Purpose of the Study:
- To develop and demonstrate a computer-vision-based algorithm for correcting SPM image distortions.
- To enable accurate overlaying of multiple SPM images for time-resolved analysis.
- To showcase the algorithm's application in diverse nanoscale material systems.
Main Methods:
- An innovative computer-vision algorithm for offline processing of SPM data.
- Application to tracking polarization switching in Pb(Zr0.2Ti0.8)O3 thin films.
- Application to analyzing graphene wrinkling on a PET substrate under strain.
Main Results:
- Accurate overlaying of SPM images with minimal error, correlating position, time, and functionality.
- Detailed tracking of domain nucleation and domain wall motion during polarization switching.
- Observation and tracking of individual wrinkle relaxation in strained graphene.
Conclusions:
- The developed algorithm effectively corrects SPM distortions, enhancing metrological capabilities.
- This approach allows precise correlation of nanoscale phenomena with their temporal evolution.
- The method is versatile, applicable to various functional materials and dynamic processes.
