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Related Experiment Videos

Synchronous scanning mode of industrial computed tomography for multiple objects test.

Fenglin Liu1,2, Chao Quan1, Weiwen Wu1

  • 1Key Lab of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China.

Journal of X-Ray Science and Technology
|April 8, 2017
PubMed
Summary

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This study introduces a new industrial computed tomography (CT) scanning method using multiple synchronized turntables. This approach enhances testing efficiency for small, dense objects without needing higher energy X-rays.

Area of Science:

  • Industrial CT imaging
  • Non-destructive testing
  • Materials science

Background:

  • Industrial CT systems test multiple small, dense objects simultaneously for efficiency.
  • Testing dense objects requires high-energy X-rays and wide-dynamic range detectors.
  • Current methods face limitations with increased X-ray penetration paths.

Purpose of the Study:

  • To propose and test a novel CT scanning method for improved efficiency.
  • To avoid the need for enhanced X-ray sources or detectors.
  • To reduce scanning time for multiple objects.

Main Methods:

  • Developed a method using linear arrangement and synchronous-rotating multi-turntables.
  • Objects are placed on individual turntables, rotating synchronously.
Keywords:
Computed tomographyimage reconstructionmulti-turntablessynchronous rotatingtest efficiency

Related Experiment Videos

  • X-rays penetrate only a single object during scanning.
  • Deduced a filtered back projection algorithm for image reconstruction.

    • Main Results:

    • Computer simulations and experiments verified the method's feasibility.
    • Scanning time reduced to 5-8 minutes for 3-5 groups of objects.
    • Successfully scanned multiple small, high-density objects efficiently.

    Conclusions:

    • The novel multi-turntable CT scanning method is efficient and feasible.
    • This technique eliminates the need for high-energy X-ray sources and wide-dynamic range detectors.
    • Significant reduction in scanning time is achieved for industrial CT applications.