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Sub-Pixel Extraction of Laser Stripe Center Using an Improved Gray-Gravity Method.
Yuehua Li1, Jingbo Zhou2, Fengshan Huang3
1School of Mechanical Engineering, Hebei University of Science and Technology, Shijiazhuang 050018, China. yuehua.hrbin@163.com.
Sensors (Basel, Switzerland)
|April 11, 2017
Summary
An improved gray-gravity method (IGGM) enhances laser stripe center extraction for line structured light sensors. This method achieves high accuracy sub-pixel coordinates efficiently, even for complex shapes.
Area of Science:
- Computer Vision
- Metrology
- Optical Engineering
Background:
- Accurate profile measurement is crucial for line structured light sensors (LSLS).
- Sub-pixel level laser stripe center extraction is a fundamental challenge in LSLS applications.
- Existing methods may struggle with complex stripe geometries or computational efficiency.
Purpose of the Study:
- To propose an improved gray-gravity method (IGGM) for accurate laser stripe center extraction.
- To enhance sub-pixel coordinate determination for profile measurements.
- To evaluate the method's performance on various stripe types and complex surfaces.
Main Methods:
- Initial center point computation using the gray-gravity method (GGM).
- Robust fitting of points with the moving least squares algorithm to obtain tangential and normal vectors, and radius of curvature.
- Adaptive rectangular region definition based on curvature for refined center coordinate recalculation.
- Monte Carlo analysis for center uncertainty estimation.
Main Results:
- The IGGM successfully extracts sub-pixel accurate center coordinates for laser stripes.
- The method demonstrates robustness for both smooth stripes and those with sharp corners.
- Experimental results on stairs and screw surfaces validate the effectiveness of the IGGM.
- High accuracy is achieved at a relatively low computational cost.
Conclusions:
- The proposed IGGM offers a significant improvement for laser stripe center extraction in LSLS.
- It provides a computationally efficient and accurate solution for profile measurement.
- The method's adaptability to different stripe shapes makes it broadly applicable.