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Updated: Aug 3, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Direct Observation of Impurity Segregation at Dislocation Cores in an Ionic Crystal
Eita Tochigi1, Yuki Kezuka1, Akiho Nakamura1
1Institute of Engineering Innovation, The University of Tokyo , 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan.
Abstract:
Dislocations, one-dimensional lattice defects, are known to strongly interact with impurity atoms in a crystal. This interaction is generally explained on the basis of the long-range strain field of the dislocation. In ionic crystals, the impurity-dislocation interactions must be influenced by the electrostatic effect in addition to the strain effect. However, such interactions have not been verified yet. Here, we show a direct evidence of the electrostatic impurity-dislocation interaction in α-Al2O3 by visualizing the dopant atom distributions at dislocation cores using atomic-resolution scanning transmission electron microscopy (STEM). It was found that the dopant segregation behaviors strongly depend on the kind of elements, and their valence states are considered to be a critical factor. The observed segregation behaviors cannot be explained by the elastic interactions only, but can be successfully understood if the electrostatic interactions are taken into account. The present findings will lead to the precise and quantitative understanding of impurity induced dislocation properties in many materials and devices.
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