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Current redistribution in resistor networks: Fat-tail statistics in regular and small-world networks
Jörg Lehmann1, Jakob Bernasconi1
1ABB Switzerland Ltd., Corporate Research, Segelhofstrasse 1K, CH-5405 Baden-Dättwil, Switzerland.
Abstract:
The redistribution of electrical currents in resistor networks after single-bond failures is analyzed in terms of current-redistribution factors that are shown to depend only on the topology of the network and on the values of the bond resistances. We investigate the properties of these current-redistribution factors for regular network topologies (e.g., d-dimensional hypercubic lattices) as well as for small-world networks. In particular, we find that the statistics of the current redistribution factors exhibits a fat-tail behavior, which reflects the long-range nature of the current redistribution as determined by Kirchhoff's circuit laws.