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Electron holography on HfO2/HfO2-x bilayer structures with multilevel resistive switching properties

G Niu1,2, M A Schubert2, S U Sharath3

  • 1Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.

Nanotechnology
|May 3, 2017
PubMed
Abstract

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