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Updated: Mar 2, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Nikolaos Farmakidis1, Keith A Brown1,2
1Department of Mechanical Engineering, Boston University , Boston, Massachusetts 02215, United States.
We developed a new Atomic Force Microscopy (AFM) method to precisely measure liquid mass on a probe. This technique enables quantitative analysis of nanoscale soft material transport and improves nanopatterning.
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