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Laser-preparation of geometrically optimised samples for X-ray nano-CT
J J Bailey1, T M M Heenan1, D P Finegan1
1Department of Chemical Engineering, University College London, London, U.K.
Journal of Microscopy
|May 16, 2017
Summary
A new laser micro-machining and focused-ion beam milling technique creates robust, micron-sized pillars for X-ray nano-computed tomography (nano-CT) imaging. This versatile method optimizes sample preparation for diverse materials in various nano-CT investigations.
Area of Science:
- Materials Science
- Geoscience
- Physics
Background:
- X-ray nano-computed tomography (nano-CT) requires meticulously prepared samples for high-resolution imaging.
- Existing sample preparation methods can be time-consuming, costly, or unsuitable for diverse material types.
Purpose of the Study:
- To present a robust and versatile sample preparation technique for fabricating cylindrical pillars for nano-CT.
- To demonstrate the applicability of the technique across a range of energy and geological materials.
Main Methods:
- The procedure combines cost-effective laser micro-machining with optional focused-ion beam (FIB) milling.
- This approach yields mechanically robust, micron-scale samples tailored for nano-CT field-of-view (FOV).
Main Results:
- The technique successfully produced geometrically optimized pillars from various materials.
- Sample dimensions and shapes were tailored to the attenuation coefficients of constituent phases.
Conclusions:
- This method provides a bespoke solution for preparing samples for both laboratory and synchrotron-based X-ray nano-CT.
- The technique enhances the quality and applicability of nano-CT imaging for a wide array of materials.
