Effects of a local defect on one-dimensional nonlinear surface growth
Hyungjoon Soh1, Yongjoo Baek2, Meesoon Ha3
1Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea.
Physical Review. E
|May 17, 2017
Summary
The slow-bond problem in Kardar-Parisi-Zhang (KPZ) universality is resolved. New simulations show the critical defect strength converges to zero, not a positive value, as system size increases.
Area of Science:
- Statistical physics
- Complex systems
Background:
- The Kardar-Parisi-Zhang (KPZ) universality class describes interfaces in various physical systems.
- A key unresolved issue is the slow-bond problem, concerning the minimal defect strength (εc) affecting KPZ universality.
Purpose of the Study:
- To resolve the discrepancy between analytical predictions (εc=0) and numerical observations (εc>0) for the slow-bond problem.
- To determine the true critical defect strength within the KPZ universality class.
Main Methods:
- Finite-size scaling analyses were employed to study slow-bond effects.
- Extensive Monte Carlo simulations were conducted under varying boundary conditions.
Main Results:
- The study provides evidence that a previously reported non-zero critical defect strength (εc) is an artifact.
- Observed non-zero εc arises from a crossover phenomenon, not a true critical threshold.
Conclusions:
- The critical defect strength (εc) for the slow-bond problem in the KPZ universality class logarithmically converges to zero as system size increases.
- This resolves the long-standing debate, aligning numerical findings with analytical predictions.
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