SU-E-I-77: X-Ray Coherent Scatter Diffraction Pattern Modeling in GEANT4

Area of Science:

• Physics
• Computational Physics
• Materials Science

Background:

• GEANT4 simulations are crucial for material detection experiments.
• Current GEANT4 models accurately simulate coherent scatter cross-sections but lack crystalline diffraction patterns.
• Accurate modeling of diffraction patterns is essential for advanced material analysis.

Purpose of the Study:

• To develop and validate a model for X-ray coherent scatter diffraction patterns in GEANT4.
• To enable material detection simulations using measured diffraction patterns.
• To incorporate crystalline material diffraction into GEANT4 simulations.

Main Methods:

• Modified GEANT4 form factors by introducing an interference function for angular dependence.
• Replaced inherent GEANT4 form factors with modified ones.
• Validated simulation results against experimental X-ray diffraction images using key metrics.

Main Results:

• Monochromatic simulations showed sharp diffraction rings consistent with wavelength dependence.
• Polychromatic simulations exhibited radial blur due to energy spread.
• Simulated and experimental patterns showed excellent agreement in ring count, position, and intensity.

Conclusions:

• The developed model accurately and efficiently simulates coherent scatter diffraction in GEANT4.
• The model integrates seamlessly without affecting simulation accuracy or runtime.
• This advancement supports enhanced material detection capabilities through diffraction pattern analysis.