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Updated: Mar 1, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Correction to Formation and Dynamics of Electron-Irradiation-Induced Defects in Hexagonal Boron Nitride at Elevated

Thang Pham, Ashley L Gibb, Zhenglu Li

    Nano Letters
    |May 26, 2017
    PubMed
    Abstract

    No abstract available in PubMed .

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